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[01-02, 2000] 

Journal of Electrical Engineering, Vol 51, 01-02 (2000)

SQUEEZING OF THE CHARGE DEEP LEVEL TRANSIENT SPECTRA CAUSED BY THE MEYER-NELDEL RULE

Peter Kluvánek - Drahoslav Barančok - Ľubomír Keleši

   Presented paper is devoted to the analysis of the impact of the Meyer-Neldel rule on charge deep level transient spectroscopy (QDLTS) in the case of continuously distributed relaxation times. The presence of the Meyer-Neldel rule deforms the shape of the QDLTS responses, which can lead to erroneous interpretation. It was found that the most dramatic deformation appears at a critical temperature T0. An easy way is suggested how to attest the presence of the Meyer-Neldel rule in the material used in experiment.

Keywords: Deep level transient spectroscopy, Meyer-Neldel rule, distribution of relaxation times


[full-paper]


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