PLANARIZATION OF MICROELECTRONIC STRUCTURES BY USING POLYIMIDES
Ladislav Matay - Róbert Andok
In the recent years there has been an increasing demand for new types of polyimides which could planarize topographies
of microelectronic structures by conserving all of their electro-physical properties for a given application. In this
work, planarization properties have been examined for the PPID polyimide material. Profilometer technique has been used
to measure step height changes of isolated lines of various dimensions. A model of local and global planarization has
been completed. Thermogravimetric analysis (TGA) has been used to evaluate thermal processes in the PPID polyimide.
Keywords: polyimides, planarization, degree of planarization, RIE, application
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