THE COMPUTATION OF EQUIVALENT MODEL PARAMETERS FOR DIELECTRIC MATERIALS
This paper describes the computation of expanded equivalent model
parameters by Maxwell - Wagner for dielectric materials. The
values of RC elements of the model are calculated from the observed
absorption or resorption currents. The principles of their
analysis are described.
Keywords: pattern recognition, insulation system, degradation, current response, minimal distance, Fourier transformation, polarization process, time of stabilization