A MODEL FOR DIELECTRIC BREAKDOWN IN INTEGRATED CIRCUITS USING CELLULAR AUTOMATA

Ioannis Karafyllidis - Michael G. Danikas - Nikolaos Georgoulas - Adonios Thanailakis

   A predictive model for the simulation of dielectric breakdown in integrated circuits, due to the effect of encapsulated contamination in the dielectric, is developed. The encapsulated contamination reduces locally the permittivity of the dielectric, resulting in an increase of the local electric field gradient. This increased field may accelerate the electrons sufficiently to produce impact ionization. The dielectric breakdown is modelled using Cellular Automata.

Keywords: integrated circuits, insulation, breakdown, cellular automata

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