EXPERIMENTAL CASE STUDY OF THE IMPACT OF IEEE 1149.4 ANALOG BOUNDARY MODULES ON CIRCUIT PERFORMANCE

Franc Novak - Marina Santo Zarnik - Uroš Kač - Srečko Maček

   The paper presents some results of the experiments with IEEE 1149.4 KLIC Test Chip in the area of active RC filters implemented in thick-film hybrid technology. The impact of analog boundary modules (ABMs) on circuit performance is analyzed in the case study of active RC notch filter.

Keywords: mixed signal test, boundary scan, design for testability, test standards

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