EXPERIMENTAL CASE STUDY OF THE IMPACT OF IEEE 1149.4 ANALOG BOUNDARY MODULES ON CIRCUIT PERFORMANCE
Franc Novak - Marina Santo Zarnik - Uroš Kač - Srečko Maček
The paper presents some results of the experiments with
IEEE 1149.4 KLIC Test Chip in the area of active RC filters
implemented in thick-film hybrid technology. The impact of
analog boundary modules (ABMs) on circuit performance
is analyzed in the case study of active RC notch filter.
Keywords: mixed signal test, boundary scan, design for testability, test standards