MEASURING STATIC PARAMETERS OF EMBEDDED ADC CORE

Franc Novak – Peter Mrak – Anton Biasizzo

   The paper presents the results of a feasibility study of measuring static parameters of ADC cores embedded in a System-on-Chip. Histogram based technique is employed because it is suitable for built-in self-test. While the theoretical background of the technique has been covered by numerous papers, less attention has been given to implementations in practice. Our goal was the implementation of histogram test in a IEEE Std 1500 wrapper. Two different solutions pursuing either minimal test time or minimal hardware overhead are described. The impact of MOS switches at ADC input on the performed measurements was considered.

Keywords: ADC static parameters, histogram based test, built-in self-test, system-on-chip

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