INFLUENCE OF RADIATION ON THE DIELECTRIC PROPERTIES OF XLPE BASED INSULATION SYSTEMS

Vladimír Ďurman – Jaroslav Lelák

   The paper discusses the possibilities of acquiring and processing the dielectric data in the range of very low frequency (VLF) and also design and construction of an impedance anlayzer for measurements in this frequency range. The impedance measurements in the VLF range were used for investigation of the influence of radiation on the cross-linked polyethylene cable dielectric. An expressive -type relaxation process was found in this type of cable. Most of the dielectric response parameters of the process depend significantly on the absorbed dose of radiation. The analysis of the process parameters showed that the most probable reason of the structural changes in cross-linked polyethylene was additional cross-linking. The results also proved that the impedance measurements in the VLF range could be effectively used in practice for estimation of the absorbed dose in the cross-linked polyethylene cables stressed by radiation.t data only. In order to identify or classify motion, data processing in real time is needed.

Keywords: cable diagnostics, dielectric spectroscopy, very low frequency, relaxation

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