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[6, 2015] 

Journal of Electrical Engineering, Vol 66, 6 (2015) 334-338 DOI: 10.1515/jee-2015-0055

INVESTIGATION OF HELIUM IMPLANTED Fe-Cr ALLOYS BY MEANS OF X-RAY DIFFRACTION AND POSITRON ANNIHILATION SPECTROSCOPY

Patrik Novák – Aleksandr Gokhman – Edmund Dobročka – Jozef Bokor – Stanislav Pecko

   X-ray diffraction (XRD) and positron annihilation spectroscopy (PAS) have been used for the characterization of the two binary alloys Fe-Cr with Cr content 2.36 and 8.39 wt%. The influence of ion implantation on these alloys was studied. Different implantation doses of helium, up to 0.5 C/cm2, were used to simulate neutron-induced damage in a sub-surface region. To characterize the damage, a lattice parameter, coherent domain size, residual stress and a crystallographic texture have been studied by grazing incidence X-ray diffraction (GIXRD). It was found out that these parameters showed a similar dependence on the implantation dose as the positron lifetime determined by positron annihilation spectroscopy.

Keywords: grazing incidence, helium implantation, positron annihilation spectroscopy, radiation damage, x-ray diffraction


[full-paper]


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