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[07-08, 2000] 

Journal of Electrical Engineering, Vol 51, 07-08 (2000) 199-202

COMPLEX PERMITTIVITY MEASUREMENTS USING SCALAR NETWORK ANALYSER

Jaroslav Franek - Pavel Kaboš

   A novel experimental technique is presented for the X band measurements of the complex permittivity components. Scalar Automatic Network Analyser (SANA) is used for a broadband waveguide measurement of the reflection coefficient, and the experimental data are processed by a simple analysis. The application of the technique for low and/or high permittivity materials with different losses is discussed.

Keywords: complex permittivity, dielectric constant, loss factor, microwave measurements, permittivity measurements, reflection method


[full-paper]


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