Jan JEŘÁBEK – Roman ŠOTNER – Kamil VRBA:
TUNABLE UNIVERSAL FILTER WITH CURRENT FOLLOWER AND TRANSCONDUCTANCE AMPLIFIERS AND STUDY OF PARASITIC INFLUENCES
/317-326; DOI: 10.2478/v10187-011-0051-x/  [abstract]   [full-paper]

Brian COGAN – Annraoi M de PAOR:
ANALYTIC ROOT LOCUS AND LAMBERT W FUNCTION IN CONTROL OF A PROCESS WITH TIME DELAY
/327-334; 10.2478/v10187-011-0052-9/  [abstract]   [full-paper]

Zvonimir KLAIĆ – Damir ŠLJIVAC – Zoran BAUS:
PROBABILITY DENSITY FUNCTIONS OF VOLTAGE SAGS MEASURED INDICES
/335-341; DOI: 10.2478/v10187-011-0053-8/  [abstract]   [full-paper]

Jakub NOVÁK – Petr CHALUPA – Vladimír BOBÁL:
OPTIMAL DISPATCH OF ANCILLARY SERVICES VIA SELF-ORGANIZING MIGRATION ALGORITHM
/342-348; DOI: 10.2478/v10187-011-0054-7/  [abstract]   [full-paper]

Boyan TOMOVSKI – Frank GRÄBNER – Axel HUNGSBERG
– Christian KALLMEYER – Mario LINSEL:
EFFECTS OF ELECTROMAGNETIC FIELD OVER A HUMAN BODY, SAR SIMULATION WITH AND WITHOUT NANOTEXTILE IN THE FREQUENCY RANGE 0.9-1.8 GHz
/349-354 DOI: 10.2478/v10187-011-0055-6/  [abstract]   [full-paper]

Juraj RACKO – Miroslav MIKOLÁŠEK –– Peter BENKO – Ondrej GALLO
– Ladislav HARMATHA – Ralf GRANZNER – Frank SCHWIERZ:
COUPLED DEFECT LEVEL RECOMBINATION IN THE P-N JUNCTION
/355-358; DOI: 10.2478/v10187-011-0056-5/  [abstract]   [full-paper]

Peter MRAK – Anton BIASIZZO – Franc NOVAK:
ON MEASUREMENT UNCERTAINTY OF ADC NONLINEARITIES IN OSCILLATION-BASED TEST
/359-362; DOI: 10.2478/v10187-011-0057-4/  [abstract]   [full-paper]

Ivan HOTOVÝ – Ivan KOSTIČ – Štefan HAŠČÍK – Vlastimil REHÁČEK
– Jozef LIDAY – Helmut SITTER:
DEVELOPMENT AND FABRICATION OF Ti₂ TIP ARRAYS FOR GAS SENSING
/363-366; DOI: 10.2478/v10187-011-0058-3/  [abstract]   [full-paper]

Jozef LIDAY – Peter VOGRINČIČ – Gernod ECKE:
SOME ASPECTS OF QUANTITATIVE ANALYSIS OF TERNARY ALLOYS OF GROUP III-NITRIDES BY AUGER ELECTRON
/367-369; DOI: 10.2478/v10187-011-0059-2/  [abstract]   [full-paper]

Pavol BREZINA:
The development of stereophonic sound in Slovakia
/370-374; DOI: 10.2478/v10187-011-0060-9/  [abstract]   [full-paper]