Jan Leuchter – Ngoc Nam Pham – Huy Hoang Nguyen:
Automatic test-bench for SiC power devices using LabVIEW
/77-85, https://doi.org/10.2478/jee-2024-0011/  [abstract]   [full-paper]

Ümit Can Ünal – Kamil Karaçuha – Sehabeddin Taha İmeci:
A simple 90° hybrid branchline coupler with wideband phase balance for 5G applications
/86-93, https://doi.org/10.2478/jee-2024-0012/  [abstract]   [full-paper]

Anuratha Kesavan – Nandhini Jembu Mohanram – Soshya Joshi – Uma Sankar:
Deep reinforcement learning based computing offloading in unmanned aerial vehicles for disaster management
/94-101, https://doi.org/10.2478/jee-2024-0013/  [abstract]   [full-paper]

Zifeng Guo – Jian Liu:
A Ku band low-voltage and low-power CMOS low-noise amplifier with bulk isolation techniques
/102-112, https://doi.org/10.2478/jee-2024-0014/  [abstract]   [full-paper]

Jiří Přibil – Anna Přibilová – Ivan Frollo:
Contact measurement of skin temperature using a wearable two-channel PPG optical sensor supplemented by thermometers
/113-123, https://doi.org/10.2478/jee-2024-0015/  [abstract]   [full-paper]

Mukesh Kumar – M. Senthil Kumar:
Performance enhancement of band-pass FIR filter-based M-class phasor estimation
/124-136, https://doi.org/10.2478/jee-2024-0016/  [abstract]   [full-paper]

Šimon Grác – Peter Beňo – František Duchoň – Michal Malý – Martin Dekan:
Object classification with aggregating multiple spatial views using a machine-learning approach
/137-150, https://doi.org/10.2478/jee-2024-0017/  [abstract]   [full-paper]

Kamal Garg – Shashi Shekhar:
Fault sensitivity index-based multi-objective testcase prioritization
/151-160, https://doi.org/10.2478/jee-2024-0018/  [abstract]   [full-paper]

Dragan Mitić – Aleksandar Lebl – Žarko Markov:
Influence of power control in the mobile network on the radiation level
/161-165, https://doi.org/10.2478/jee-2024-0019/  [abstract]   [full-paper]

Fei Du – Hao Yu – Shuai Yuan – Jiangang Bi – Dehui Fu:
Stability and reliability analysis for broadband current array sensing system applied to GIS
/166-172, https://doi.org/10.2478/jee-2024-0020/  [abstract]   [full-paper]